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Mekmin mind LNX-7530-GL

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Mekmin mind LNX-7530-GL

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  • Prod No. :
    309758
  • Manufacturing date :
    -
  • Stock holdings

Product information

LNX-7530-GL supports X-axis resolution of 11 um, Z-axis repeat precision of 0.2 um, and F.S. linearity of ± 0.02%. Advanced optical design and AI algorithms can generate 3,200 data points per profile to inspect features of very fine areas such as dents, gaps, and edges.High resolution, high speed scan speed, 0.2 μm repeat precision, single-shot HDR lithium battery cell upper cover welding inspection 0.2 μm Z-axis repeat precision enables high precision and high speed imaging of fine welds.Pin height measurements Advanced optical design and algorithms can generate high-resolution 3D data (3,200 data points per profile) for each pin with high reflectivity from various types of distractions such as blind spots and spikes.It detects various external defects such as the presence or absence of battery terminal quality inspection terminals, welding, and overlap, while accurately measuring the terminal height, and boasts high accuracy with over-check rate Application EV battery cell upper cover welding inspection background and difficulty ● The welding quality of the cell upper cover directly affects the performance and safety of the lithium battery.● Defects such as cracks, pits, pores, lack of penetration, and undercuts are likely to occur during the welding process.● The EV battery industry requires high accuracy, cycle time.Results ● The Mech-Eye LNX series enables high-resolution, high-resolution imaging of fine welds with high resolution and high-speed scan speeds.● The anti-reflection algorithm effectively solves problems such as missing point clouds and outliers caused by high-reflection facilities.● Based on large learning algorithms, various defects such as lack of weld penetration, pores, and undercuts can be quickly identified, and based on measurement algorithms, the shape, size, and depth of defects can be accurately measured.
Automotive connector pin inspection
Background and difficulty
● Due to the structure of the small, detailed pin, the inspection system has a high demand for resolution and accuracy.● The special shape and structure of the pin easily deforms the tip of the pin.● Noise caused by mutual reflection between pins affects image quality.
Results
● Self-developed antireflection algorithms effectively suppress mutual reflection interference and create accurate point clouds.● The feature extraction and measurement algorithm of the Mech-MSR identifies the end of each pin in detail to accurately measure the height and position of the pin.

Sale Company

CEO Name Jeong Jin-sung
Phone 0504-3105-5782
Homepage www.tjsystems.co.kr
Email js.jung@tjsystems.co.kr
Address Room 2025, Ba-dong, 282, Hakui-ro, Dongan-gu, Anyang-si, Gyeonggi-do, Republic of Korea
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